This probe set is used to measure conducted emissions 1 Ohm/150 Ohm with the direct coupling method on IC pins. The S603 probe is used for current measurement and the S750 probe is used for voltage measurement.
The measurements with the S603/S750 ensure a high repeatability and comparability of the measurements. The measurements can be performed with the ChipScan-ESA software. The measurement results of all measured pins are saved with the help of the software. It allows systematically and quickly comparison and analysis of the measured data.
Scope of delivery
- 1xS603, 1 Ohm, RF Current Probe, 0 kHz - 3 GHz acc. to IEC 61967-4
- 1xS750, 150 Ohm, RF Voltage Probe, 100 kHz - 3 GHz acc. to IEC 61967-4
- 1xSMA-SMA 1 m, SMA-SMA Measuring Cable
Langer EMV S603/S750 Probe Set 1Ω/150Ω Conducted RF Measurement acc. IEC 61967-4
Please allow 2 - 3 weeks lead time for this new product to arrive.
Made and manufactured in Germany.
Comes with a One Year warranty from the manufacturer.