The P250 probe is used for direct-contact measurements of impulse immunity in IC pins, according to IEC 62215-3 and IEC 61000-4-4. Knowledge of impulse immunity parameters through use of the P250 probe makes optimization of the IC and definition of application requirements possible. The probe P250 has interchangeable heads, which allows for coupling capacity to be changed. The included power cable is terminated with a SHV-connector. A power cable terminated on both ends with a Fischer-connector S103A023 can be selected instead.
**Please note this set requires Langer ICE1 Test Set**
Link to ICE1: https://www.stratatek.com/product-page/langer-emv-ice1-set-ic-test-environment
Scope of delivery
- 1xP250, EFT Coupling Network
- 1xTS 250-2.2p, Probe Tip 2.2 pF
- 1xTS 250-10p, Probe Tip 10 pF
- 1xTS 250-1n, Probe Tip 1 n
- 1xTS 250-100p, Probe Tip 100 pF
- 1xTS 250-100n, Probe Tip 100 nF
- 1xSM 02-01, Shunt
- 1xHV FI-SHV 1m, High-Voltage Cable Fischer-SHV
- 1xP250 case, System Case
- 1xP250 m, P250 Set User manual
Langer EMV P250 Probe Set EFT/Burst Injection up to 6 kV
Please allow 2 - 3 weeks lead time for this new product to arrive.
Made and manufactured in Germany.
Comes with a One Year warranty from the manufacturer.
The EFT coupling network P250 is used for the coupling of burst pulses to ICs according to IEC 62215-3. The probe P250 is connected to an EFT / Burstgenerator (IEC 61000-4-4). The probe P250 has interchangeable heads, which allows for coupling capacity to be changed. This means that the IC can be tested in shorter period of time.
Input impedance 50 Ω Pulse parameter Shape 5 / 50 ns Max. input voltage RF ± 6 kV Connector - input 50 Ω Fischer (D103A023)