The probe set is used to measure conducted emissions (measurements with direct 1 Ohm/150 Ohm-coupling) according to IEC 61967-4 at IC pins. For the current and voltage measurement there is one respective probe available. Every Test-IC pin can be reached and contacted by the probe.
The measurements with the probe set guarantee a high precision when repeated and comparability of measurements. The ICE1 IC test environment of Langer EMV-Technik is used to start the test IC. measurements can be done with ChipScan-ESA software. Measurement results of all measured pins are saved in the software and can be compared fast and systematically.
**Please note this set requires Langer ICE1 Test Set**
Link to ICE1: https://www.stratatek.com/product-page/langer-emv-ice1-set-ic-test-environment
P603-1/P750 Setconsists of:
- 1xP603-1, RF Current Probe 1 Ohm
- 1xP750, RF Voltage Probe 150 Ohm
- 1xCS-ESA, ChipScan-ESA Software, USB
- 1xSMA-SMB 1 m, SMA-SMB Measuring Cable
- 1xP603 / P750 case, System Case
- 1xP603-1 / P750 m, P603 / P750 Set User Manual
Langer EMV P603-1/P750 Set IC Test System RF Conducted Measurement IEC 61967-4
Please allow 2 - 3 weeks lead time for this new product to arrive.
Made and manufactured in Germany.
Comes with a One Year warranty from the manufacturer.