The probe set is used to measure conducted emissions (measurements with direct 1 Ohm/150 Ohm-coupling) according to IEC 61967-4 at IC pins. For the current and voltage measurement there is one respective probe available. Every Test-IC pin can be reached and contacted by the probe.

The measurements with the probe set guarantee a high precision when repeated and comparability of measurements. The ICE1 IC test environment of Langer EMV-Technik is used to start the test IC. measurements can be done with ChipScan-ESA software. Measurement results of all measured pins are saved in the software and can be compared fast and systematically.

 

**Please note this set requires Langer ICE1 Test Set** 

Link to ICE1: https://www.stratatek.com/product-page/langer-emv-ice1-set-ic-test-environment 

 

P603-1/P750 Setconsists of:

  • 1xP603-1, RF Current Probe 1 Ohm
  • 1xP750, RF Voltage Probe 150 Ohm
  • 1xCS-ESA, ChipScan-ESA Software, USB
  • 1xSMA-SMB 1 m, SMA-SMB Measuring Cable
  • 1xP603 / P750 case, System Case
  • 1xP603-1 / P750 m, P603 / P750 Set User Manual

Langer EMV P603-1/P750 Set IC Test System RF Conducted Measurement IEC 61967-4

$7,569.00Price
  • Please allow 2 - 3 weeks lead time for this new product to arrive.

    Made and manufactured in Germany.

    Comes with a One Year warranty from the manufacturer.

For Sales, Calibration, or Repair Services Call 1 888-868 -4546

Contact Us 

750 Oakdale Rd Unit 52

Toronto, Ontario

M3N 2Z4 Canada

Local: (905) 406-0100

info@stratatek.com 

1 888 - 868 - 4546

Logo.gif
EA logo.PNG

We Accept

Visit our Top Rated Seller

eBay and Amazon Stores

Amazowl-StoresGuide-Icon-StoresGuide-con
Langer-LogoII.png
  • Facebook - Grey Circle