The SX1 set consists of three passive near-field probes for measuring E-fields and magnetic fields with a high clock frequency from 1 GHz to 10 GHz on electronic assemblies and ICs during the development stage. The different probe heads of the SX1 set allow for measurements very close to the electronic assemblies, e.g. on single IC pins, conducting paths, components, and connectors, in order to localize interference sources. An electronic assembly’s field orientation and field distribution can be detected through specific use of the near-field probe. The near-field probes are small and handy. They have a current attenuating sheath and, therefore, are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input.
SX1 Set consists of:
- 1xSX-E 03, E-Field Probe 1 GHz up to 10 GHz
- 1xSX-B 3-1, H-Field Probe 1 GHz up to 10 GHz
- 1xSX-R 3-1, H-Field Probe 1 GHz up to 10 GHz
- 1xSMA-SMA 1 m, SMA-SMA Measuring Cable
- 1xCase 4, System Case Near-Field Probes
Langer EMV SX1 Set Near-Field Probes 1 GHz up to 10 GHz
Please allow 4-5 weeks lead time for this new product to arrive.
Frequency range 1 GHz - 10 GHz Connector SMA, female, jack Weight 200 g