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The field sources, which are included in the probe set field coupling 200 ps Langer ESD, generate very fast electric and magnetic ESD pulse fields. With these fields, ICs are defined and reproducibly pulsed to determine their immunity against ESD fields. The reason for this is the ESD immunity of PC boards and electrical devices. The immunity is tested (IEC 61000-4-2). During the tests, standard ESD pulse fields and very fast electric and magnetic fields (200 ps) are generated by coupled ESD interference into the PC boards. These fields affect the PC board surface and penetrate the IC casings. If fields penetrate the ICs, disturbance events will be generated. The IC interference via magnetic or electrical fields is a significant source of interference path in addition to conducted coupling of ESD interference above the ICs. From the probe set, knowledge will be gained of the IC EMC behaviour and this can be streamlined into the development of the PC board. Expensive redesigns are avoided and development costs are reduced. Furthermore, the use of the test methods for the determination of IC EMC parameters enables the IC producer to develop ICs more efficiently. The test set-up needs the ICE1 test system and external devices.

 

Scope of delivery:

  • 1xP1202 L-ESD, ESD Magnetic Field Source Langer Pulse 0.2/2.5 ns
  • 1xP1301 L-ESD, ESD E-Field Source Langer Pulse 0.2/5.5 ns
  • 1xBPS 203, Burst Power Station
  • 1xBPS 203-Client, Control Software
  • 1xBPM 02, dB/dt Field Meter
  • 1xEPM 02, dE/dt Field Meter
  • 2xSMA-SMB 1 m, SMA-SMB Measuring Cable
  • 1xHV FI-FI 1 m, High-Voltage Cable, Fischer-Fischer
  • 1xFBK 12P 1m, Control Cable
  • 1xUSB-AB, USB Cable Type A-B
  • 1xD70 h03, Spacer Ring, 3 mm
  • 1xD70 h10, Spacer Ring, 10 mm
  • 1xNT Ex EU, Power Supply Unit
  • 1xP1202 / P1301 acc, Accessories
  • 1xP1202 / P1301 case, System Case
  • 1xP1202 / P1301 m, P1202 / P1301 Set User Manual

Langer EMV P1202/P1301 L-ESD Set Pulse H 0.2/2.5 E 0.2/5.5 ns Field Coupling

Quantity
  • Order Info

    Please allow 2 - 3 weeks lead time for this new product to arrive.

    Made and manufactured in Germany.

    Comes with a One Year warranty from the manufacturer.

  • P1202 L-ESD ESD Magnetic Field Source Langer Pulse

    The P1202 field source generates a ESD magnetic field and is designed for a defined and reproducible field coupling into ICs. The P1202 generates a pulse shaped magnetic field with an edges steepness of approx. 200ps for reproducing high frequency ESD transient responses. The probe can only be operated in combination with the BPS 203 burst power station.

    The BPS 203 povides high voltage and the control signals for the probe. The operation is managed via a PC operating surface.

    Technical parameters

    Generated magnetic flux density B (h=10mm) UGEN ∙ 0.27 · 10E-6 Vs/m²
    Pulse parameter  
    Shape 0.2 / 2.5 ns
    Frequency 0.1 Hz - 10 Hz
    Max. current ± 150 A
    Voltage ± (0.1 - 6) kV
    Ammeter /current probe  
    Measurement output 50 Ω, SMB
    Shunt 0.1 Ω
    Current correction factor R -26 dBΩ
    Connector - input 50 Ω Fischer (D103A023)
    Sizes (L x W x H) (180 x 96 x 96) mm
  • BPS 203 Burst Power Station

    The BPS 203 Burst Power Station is used as high voltage supply and control unit for ESD-probes. The unit control is connected to the user PC via an USB-interface. The control is realized by the BPS 203-client software.

    - adjustment of pulse frequency and high voltage - single pulse or pulse sequence with selectable pulse rate

    Technical parameters

    Frequency range 0.1 Hz - 30 Hz
    Output voltage ± (0.1 ... 9) kV
    Supply voltage 12 V / 1 A DC
    Interface USB
    Weight 350 g
    Sizes (L x W x H) (175 x 122 x 61) mm
    Software BPS 203-Client
  • BPM 02 dB/dt Field Meter

    The BPM 02 is a dB/dt field meter and it is used to measure the temporal change of the magnetic field strength characteristics dB/dt up to 3 GHz. The lower limit frequency depends on the measurement set-up.

    Technical parameters

    Frequency range 500 kHz - 3 GHz
    Correction oscilloscope 1.26 ∙ 106 ∙ ∫UAV dt
    Correction spectrum analyser B/dB (µT): u / dB(µV) +122 - 20 log_10 (ω/Hz)
    Correction spectrum analyser B/dB (µT): u / dB(µV) + 122 - 16 - 20 log_10 (f/Hz)
  • P1301 L-ESD ESD E-Field Source Langer Pulse 0.2/5.

    The P1301 field source generates an ESD electric field and is designed for a defined and reproducible field coupling into ICs. The P1301 generates a pulse shaped E-field with an edge steepness of approx. 200 ps for reproducing high frequency ESD transient responses. The probe can only be operated in combination with the BPS 203 burst power station.

    The BPS 203 povides high voltage and the control signals for the probe. The operation is carried out via a PC user interface.

    Technical parameters

    Pulse parameter  
    Shape 0.2 / 5.5 ns
    Frequency 0.1 Hz - 10 Hz
    Voltage ± (0.1 - 6) kV
    Voltage probe  
    Frequency range (0 ... 2) GHz
    Correction factor 60 dB
    Measurement output 50 Ω, SMB
    Connector - input 50 Ω Fischer (D103A023)
    Sizes (L x W x H) (180 x 96 x 96) mm
  • EPM 02 dE/dt Field Meter

    The EPM 02 is suitable for the measurement of fast transients with a bandwidth up to 3 GHz. The dE/dt field meter doesn't have a lower limit frequency. Depending on the noise limit of the used measuring device the usage of the EPM 02 is limited in the lower frequency range. For example, at a noise limit of 126 nV and a field strength of 100 V/cm the measurement limit of the EPM 02 is 1 kHz at the lower frequency. The attenuation of the dE/dt field meter decreases proportionally to the frequency.

    Technical parameters

    Frequency range 3 GHz
    Measuring output 50 Ω, SMB
    Correction oscilloscope E [V/cm]: 3,55 ∙ 1012 ∙ ∫UAV dt
    Correction spectrum analyser E/dB(µV/cm): u / dB(µV) + 251 - 20 log_10 (ω/Hz)
    Correction spectrum analyser E/dB(µV): u / dB(µV) +251 -16 - 20 log_10 (f/Hz)
    Max. RF-field strength < 1 kV/cm
    Max. pulse field strength < 100 kV/cm

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