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Langer EMV P603/P750 Set IC Test System RF Conducted Measurement Full set with case
The probe set is used to measure conducted emissions (measurements with direct 1 Ohm/150 Ohm-coupling) at IC pins. For the current and voltage measurement there is one respective probe available. Every Test-IC pin can be reached and contacted by the probe.
The measurements with the probe set guarantee a high precision when repeated and comparability of measurements. The ICE1 IC test environment of Langer EMV-Technik is used to start the test IC. measurements can be done with ChipScan-ESA software. Measurement results of all measured pins are saved in the software and can be compared fast and systematically.
 
**Please note this set requires Langer ICE1 Test Set** 
Link to ICE1: https://www.stratatek.com/product-page/langer-emv-ice1-set-ic-test-environment 
 
Scope of delivery
  • 1xP603, RF Current Probe 1 Ohm
  • 1xP750, RF Voltage Probe 150 Ohm
  • 1xCS-ESA, ChipScan-ESA Software, USB
  • 1xSMA-SMB 1 m, SMA-SMB Measuring Cable
  • 1xP603 / P750 case, System Case
  • 1xP603 / P750 m, P603 / P750 Set User Manual

Langer EMV P603/P750 Set IC Test System RF Conducted Measurement

Quantity

  • Order Info

    Please allow 2 - 3 weeks lead time for this new product to arrive.

    Made and manufactured in Germany.

    Comes with a One Year warranty from the manufacturer.

  • P603 Probe

    The P603 is a 1 ohm probe for direct measurement of high frequency (RF) current at IC pins. It is used to measure at supply pins (Vdd / Vss) and signal pins. The 1 ohm RF current probe has a pin contact with which IC pins can be separately contacted and measured.

    Technical parameters

    Frequency range 9 kHz ... 3 GHz
    Coupling capacity 8 µF
    Measuring output 50 Ω, SMB
    Transfer factor voltage -6 dB
    Ammeter /current probe  
    Shunt 1 Ω
    Current correction factor R -6 dBΩ
    Inductance 1 nH
    Max. power dissipation 2.5 W

  • P750 RF Voltage Probe 150 Ohm

    The P750 RF voltage probe corresponds to a 150 ohm coupling network according to IEC 61967-4 for the RF voltage measurement at IC pins. The P750 probe has of a high resistance, capacitive coupled input. RF voltages can be measured at different pins of the device under test.

    Technical parameters

    Frequency range 150 kHz ... 3 GHz
    Input resistance 150 Ω
    Measuring output 50 Ω, SMB
    Transfer factor voltage -15.2 dB
    Max. input voltage DC 50 V
    Max. input voltage RF 3.5 V

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