The probe set is used to measure conducted emissions (measurements with direct 1 Ohm/150 Ohm-coupling) at IC pins. For the current and voltage measurement there is one respective probe available. Every Test-IC pin can be reached and contacted by the probe.

The measurements with the probe set guarantee a high precision when repeated and comparability of measurements. The ICE1 IC test environment of Langer EMV-Technik is used to start the test IC. measurements can be done with ChipScan-ESA software. Measurement results of all measured pins are saved in the software and can be compared fast and systematically.


**Please note this set requires Langer ICE1 Test Set** 

Link to ICE1: 


Scope of delivery

  • 1xP603, RF Current Probe 1 Ohm
  • 1xP750, RF Voltage Probe 150 Ohm
  • 1xCS-ESA, ChipScan-ESA Software, USB
  • 1xSMA-SMB 1 m, SMA-SMB Measuring Cable
  • 1xP603 / P750 case, System Case
  • 1xP603 / P750 m, P603 / P750 Set User Manual

Langer EMV P603/P750 Set IC Test System RF Conducted Measurement

  • Please allow 2 - 3 weeks lead time for this new product to arrive.

    Made and manufactured in Germany.

    Comes with a One Year warranty from the manufacturer.

For Sales, Calibration, or Repair Services Call 1 (888) 868 - 4546

Contact Us 

750 Oakdale Rd Unit 52

Toronto, Ontario

M3N 2Z4 Canada

Local: (905) 406-0100 

1 (888) 868 - 4546

We Accept

Visit our Top Rated Seller

eBay and Amazon Stores

ebay top rated.png
meatest logo.png
tinsley logo.jpg
keithley logo.png
keysight logo.png
EA logo.PNG
ODA logo.png
isa logo.png
HT logo.jpg
sonel logo.jpg
saluki - Square.jpg
langer logo good.PNG
detectus logo.jpg
megiq logo.PNG
  • Facebook - Grey Circle