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This probe set is used to measure conducted emissions 1 Ohm/150 Ohm with the direct coupling method on IC pins. The S603 probe is used for current measurement and the S750 probe is used for voltage measurement.

The measurements with the S603/S750 ensure a high repeatability and comparability of the measurements. The measurements can be performed with the ChipScan-ESA software. The measurement results of all measured pins are saved with the help of the software. It allows systematically and quickly comparison and analysis of the measured data.

 

Scope of delivery

  • 1xS603, 1 Ohm, RF Current Probe, 0 kHz - 3 GHz acc. to IEC 61967-4
  • 1xS750, 150 Ohm, RF Voltage Probe, 100 kHz - 3 GHz acc. to IEC 61967-4
  • 1xSMA-SMA 1 m, SMA-SMA Measuring Cable

Langer EMV S603/S750 Probe Set 1Ω/150Ω Conducted RF Measurement acc. IEC 61967-4

Quantity
  • Order Info

    Please allow 2 - 3 weeks lead time for this new product to arrive.

    Made and manufactured in Germany.

    Comes with a One Year warranty from the manufacturer.

  • S603 Probe

    The S603 probe is a 1 Ω-probe for direct measurement of high frequency (RF) current at IC pins. It is used to measure at supply pins (Vdd / Vss) and signal pins. The S603  1 Ohm RF current probe has a pin contact with which every IC pin can be separately contacted and measured

    By means of an SMA - connection the probe can be easily connected to the IC test boards. The S603 probe is designed for measuring on ground lines (Vss).

    Technical parameters

    Frequency range 0 ... 3 GHz
    Shunt resistance 1 Ω
    Adjustment Resistance 49 Ω
    Output resistance (no load) 50 Ω
    Transfer factor voltage Uout / Uin -6 dB
    Transfer factor Current Uout / Iin -6 dBΩ
    Max. power dissipation 2.5 W
    Connectors 50 Ω, SMA
    Weight 42 g
    Sizes (L x W x H) (60 x 45 x 14) mm
  • S750 Probe

    The S750 probe is a RF-Voltmeter for conducted measurement of high frequency voltage on IC pins. The S750 complies with the 150 Ω coupling network according to IEC 61967-4 up to a frequency of 3 GHz.

    By means of a SMA connection, the S750 probe can be easily connected to the IC test board. The S750 probe is designed for measuring on signal lines.

    Technical parameters

    Frequency range 100 kHz ... 3 GHz
    Input resistance 145 Ω
    Adjustment Resistance 51 Ω
    Transfer factor voltage Uout / Uin -15.2 dB
    Max. input voltage DC 50 V
    Max. input voltage RF 3.5 V
    Connectors 50 Ω, SMA
    Weight 39 g
    Sizes (L x W x H) (60 x 45 x 14) mm

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